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Number of Layers:
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139 Records
Image Part Manufacturer Description MOQ Stock Action
KL-IDE201-E1 Kennedy Labs
IDE GROUP B, 12 DIE, FOUR WIDTHS
1
2
In-stock
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KL-IDE101-E1 Kennedy Labs
IDE GROUP A, 12 DIE, FOUR WIDTHS
1
2
In-stock
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KL-HF101-E1 Kennedy Labs
HALL EFFECT STRUCTURE ON SIO2 ON
1
2
In-stock
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KL-DC801-E1 Kennedy Labs
80 PIN DROP CASTING DIE, METAL P
1
2
In-stock
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KL-SIBN4W-E1 Kennedy Labs
4" WAFER WITH BN ON SIO2 ON SI
1
2
In-stock
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SNS-C36-1212-110-P II-VI
LINEAR SILICON NANOSTAMP: PERIOD
1
9
In-stock
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SNS-C20-0808-150-D45-P II-VI
LINEAR SILICON NANOSTAMP: PERIOD
1
5
In-stock
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S2D-24B3-0808-350-P II-VI
2D SILICON NANOSTAMP: RECTANGULA
1
5
In-stock
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SNS-C24-1212-110-P II-VI
LINEAR SILICON NANOSTAMP: PERIOD
1
5
In-stock
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S2D-24D2-0808-350-P II-VI
2D SILICON NANOSTAMP: HEXAGONAL
1
4
In-stock
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S2D-18D3-0808-350-P II-VI
2D SILICON NANOSTAMP: HEXAGONAL
1
3
In-stock
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S2D-18C2-0808-150-P II-VI
2D SILICON NANOSTAMP: HEXAGONAL
1
3
In-stock
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S2D-24C3-0808-350-P II-VI
2D SILICON NANOSTAMP: HEXAGONAL
1
3
In-stock
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S2D-18B3-0808-350-P II-VI
2D SILICON NANOSTAMP: RECTANGULA
1
3
In-stock
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S2D-24B2-0808-350-P II-VI
2D SILICON NANOSTAMP: RECTANGULA
1
3
In-stock
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S2D-24C2-0808-150-P II-VI
2D SILICON NANOSTAMP: HEXAGONAL
1
3
In-stock
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S2D-18C2-0808-350-P II-VI
2D SILICON NANOSTAMP: HEXAGONAL
1
3
In-stock
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S2D-24D3-0808-350-P II-VI
2D SILICON NANOSTAMP: HEXAGONAL
1
3
In-stock
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SNS-C20-0808-350-D45-P II-VI
LINEAR SILICON NANOSTAMP: PERIOD
1
3
In-stock
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SNS-C18-2009-140-D50-P II-VI
LINEAR SILICON NANOSTAMP: PERIOD
1
2
In-stock
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2 / 7 Page, 139 Records